Auger Electron Spectroscopy

the results of auger electron spectroscopy indicate that sn segregation occurs during continuous cooling and the degrees of segregation are different for different cooling rates.

俄歇能谱表明，Sn不仅在连续冷却过程中发生了晶界偏聚，而且Sn的晶界偏聚量随着连续冷却速率的变化而变化。

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This coordination was confirmed by UV-visible spectra, X-rayphotoelectron spectroscopy ( XPS ) and Auger electron spectroscopy ( AES ).

UV-vis 、 X—射线光电子能谱 ( XPS ) 和俄歇电子能谱 ( AES ) 证实了这种配位作用.

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the phase composition, depth profile of n, and the wear mechanisms of the modified layers were investigated by means of x ray diffraction ( xrd), auger electron spectroscopy ( aes), and scanning electron microscopy ( sem).

用扫描电子显微镜（SEM）、俄歇电子能谱仪（AES）和X射线衍射仪（XRD）考察了改性层的相组成、N元素的深度分布及磨损机理。

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a system of auger electron spectroscopy ( aes) for surface analysis was presented.

介绍了一台用于表面分析的俄歇电子能谱仪（AES）系统。

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the surface sputtering of the binary cu-ti amorphous alloy systems has been studied using low energy ion scattering spectroscopy ( iss) and auger electron spectroscopy ( aes) in this paper.

本文用低能离子散射谱（ISS）和Auger电子谱（AES）研究了二元非晶态Cu-Ti合金系的表面溅射。

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study on the interface between metal uranium and aluminum film by auger electron spectroscopy

金属铀与铝薄膜界面的俄歇电子能谱研究

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Measurements of Auger electron spectroscopy reveals that after treatment with citric acid, Al Auger chemical shift on the sillimanite surface is-0.10eV, showing a very weak chemical interaction;

Auger电子能谱仪测试表明：柠檬酸在硅线石表面作用前后Al峰的化学位移为-0.1eV，化学作用很弱。

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Analysis of microchannel plate fogging surface by Auger electron spectroscopy

微通道板表面发雾的AES分析

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the experiments were performed by means of secondary ion mass spectroscopy ( sims) and auger electron spectroscopy ( aes).

采用了二次离子质谱仪（SIMS）和俄歇电子谱仪（AES）进行表面分析。

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auger electron spectroscopy ( aes), scanning electron microscopy ( sem) and atomic force microscopy ( afm) are used to analyze component and surface morphology of the films.

用俄歇电子能谱（AES）、扫描电镜（SEM）和原子力显微镜（AFM）对薄膜的组成成分和表面形貌进行了分析。

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Study on ion mobility in the silver borophosphate glasses by using Auger electron spectroscopy

俄歇电子能谱研究银硼磷玻璃中的离子迁移性

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we have studied the interface formation process of pb/ ni ( 001) system by means of tunable-sampling-depth electron energy loss spectroscopy ( tels) and auger electron spectroscopy ( aes).

本工作用可调探测深度电子能量损失谱（ELS）与俄歇电子能谱（AES）研究Pb在Ni（001）表面的生长过程。

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the formation process of ti/ al2o3 ( 1102) interface has been studied by x-ray photoelectron spectroscopy ( xps) and auger electron spectroscopy ( aes).

用X射线光电子谱（XPS）和俄歇电子能谱（AES）研究了Ti／Al2O3界面形成的过程。

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the composition and depth distribution of elements on the surfaces of co ion implantation modified carbon fiber microelectrode were determined by scanning electron microscope and auger electron spectroscopy.

用扫描电子显微镜（SEM）和俄歇电子能谱（AES）两种表面分析技术对Co离子注入修饰微电极的表面状况、表面元素组成及深度分布进行测定。

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furthermore, the elemental composition of the rubbing surfaces was investigated through auger electron spectroscopy ( aes). the acting mechanism was also proposed.

利用Auger能谱分析了摩擦表面膜的元素成分，并探讨了其抗磨作用机理。

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Microstructures of the CdTe thin films prepared by vacuum evaporation technique were reported by the scanning electron microscope ( SEM), Auger electron spectroscopy ( AES) and x ray diffraction ( XRD).

应用真空蒸发技术制备CdTe薄膜，并借助于扫描电子显微镜（SEM）、扫描俄歇谱仪（AES）和X射线衍射仪（XRD）对其微观结构进行分析。

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dr. lee explained induced auger electron emission spectroscopy to the students.

李博士向学生们解释了诱导俄歇电子发射光谱。

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The Ge mole fraction of 15-16 % was determined by Auger electron spectroscopy ( AES ).

俄歇电子谱 ( AES) 测试表明,所制备的Si_ (1-x ) Ge_x中Ge含量约为15-16%.

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dr. lee explained angle-resolved auger electron spectroscopy to the students.

李博士向学生们解释了角分辨俄歇电子能谱。

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the thin film has been studied with energy dispersive x-rays ( edx), auger electron spectroscopy ( aes) and fourier transform infrared ( ftir).

之后采用扫描电子显微镜（SEM）、能量散射谱（EDX）、俄歇电子能谱（AES）、傅立叶变换红外光谱（FTIR）对氧化硅薄膜进行分析。

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auger electron spectroscopy ( aes) is used to study the surface structure and the depth distribution of si, c, o elements concentration changing with deposition time on the unscratched single crystalline si ( 100) substrate.

用俄歇子能谱（AES）研究了热丝法生长金刚石膜中未经划痕处理的单晶硅衬底在不同沉积时间下的表面结构及Si，C，O元素浓度的深度分布。

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corrosion of anti-rust aluminum plate was analyzed by means of optical microscope, scanning electron microscope, energy dispersive spectroscopy, auger electron spectroscopy and x-ray photon spectroscopy.

采用光学金相、扫描电镜、能量色散谱、俄歇电子能谱和X光电子能谱等多种方法分析了防锈铝板表面发生大面积腐蚀的原因。

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the thickness of the oxide film was measured by auger electron spectroscopy ( aes).

用Auger电子能谱（AES）分析氧化膜厚度。

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electrochemical technique and auger electron spectroscopy ( aes) were employed for studies on the effect of aqueous corrosion of iron by means of ion beam mixing in order to envisage the possibility for developing a new approach in surface modification of materials.

本文应用电化学及俄歇电子能谱等技术，研究了离子束混合对铁的水溶液腐蚀行为的影响，旨在探讨离子束混合作为一种材料表面改性的新途径，用于提高纯铁腐蚀性能的可能性。

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in this paper the concentration profiles of copper in the gold thin film of the au-cu system after the heat treatment of different time-intervals have been measured by auger electron spectroscopy ( phi 550).

本文利用俄歇电子能谱（PHI-550）测得了经过不同时间间隔热处理的Au-Cu系统中铜在金薄膜内的浓度剖面。

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auger electron spectroscopy study on interaction between aluminum thin layers and uranium substrate

用AES研究铝薄膜与基体金属铀之间的界面反应

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High Resolution Auger Electron Spectroscopy Analysis on Grain Boundaries of High Purity Fe-0.2% P-2% Cr-C Alloys

高纯Fe-0.2%P-2%Cr-C合金晶界的高分辨俄歇能谱分析

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Auger Electron Spectroscopy Obtained from Low Signal Noise Ratio

低信噪比的俄歇电子信号提取

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in-situ film composition analysis was carried out in the analysis chamber with auger electron spectroscopy ( aes).

利用在位俄歇电子能谱（AES）分析了薄膜表面的组分。

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Some fundamental aspects of Auger electron spectroscopy have been reviewed.

介绍了俄歇电子谱术的某些基本问题.

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